The Proceedings of the Conference on Information, Intelligence and Precision Equipment : IIP
Online ISSN : 2424-3140
2022
Session ID : IIP1R2-J03
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Development of Heat Flux Measurement Method Using Stacked Temperature Sensitive Films
Julien SAUVAGEOT*Takashiro TSUKAMOTOShuji TANAKA
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Abstract

In this paper, a novel method to directly measure the microscale heat flux using stacked temperature sensitive paints (TSPs) is proposed. Two types of TSPs were combined with the optical filter, which enables to measure the temperature difference between the front and back side of the film, eventually the heat flux across the film. The measurement system was developed which independently activates each layer of TSP and measures the luminescence from them. The basic function of the developed method was experimentally demonstrated.

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© 2022 The Japan Society of Mechanical Engineers
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