関西支部講演会講演論文集
Online ISSN : 2424-2756
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1302 誘導結合型 RF 低圧プラズマによる半導体製造装置排ガス分解に及ぼす電源周波数の影響
田中 慎吾嶺 潤子黒木 智之大久保 雅章山本 俊昭佐伯 登
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p. _13-3_-_13-4_

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CF_4 is one of the most stable gases among semiconductor processing gases and their decomposition is extremely difficult. Influence of frequency of radio frequency (RF) power on decomposition of CF_4 using inductively coupled plasma (ICP) reactor at low pressure was investigated. The frequency of RF power supply is 2MHz or 4MHz. With each frequency, complete decomposition can be obtained with certain operately conditions of ICP such as the total flow rate, the ratio of CF_4 to O_2,and RF power. The detailed discussion is presented in this paper.
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© 2003 一般社団法人 日本機械学会
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