年次大会
Online ISSN : 2424-2667
ISSN-L : 2424-2667
セッションID: J012012
会議情報
J012012 回路基板のスルーホール周りの疲労強度([J012-01]電子情報機器、電子デバイスの強度・信頼性評価と熱制御(1))
木下 貴博川上 崇水科 秀樹飯長 裕
著者情報
会議録・要旨集 フリー

詳細
抄録
Through holes were formed in printed circuit board for electric signal communication. The surface of through hole was plated by thin metal and the irregularities were shaped on the free-surface or on the interface by hole-drilling in printed circuit board. Fracture of through hole was occurred by stress concentration due to its irregularity. In this study, elastic-plastic thermal stress simulation was performed by using a large scale simulator ADVENTURECluster which was based on FEM to study fatigue strength around through hole in printed circuit board.
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© 2013 一般社団法人 日本機械学会
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