年次大会
Online ISSN : 2424-2667
ISSN-L : 2424-2667
セッションID: S133012
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S133012 Siのエッチング援用スライスにおける切断特性の向上([S133]先進砥粒加工技術)
村田 順二土田 剛史谷 泰弘張 宇桐野 宙治川波多 裕司
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Si wafers for solar cells are fabricated by slicing ingot using mechanical slicing method such as multi-wire sawing. Recently, the slicing method for achieving low kerf loss and thin wafer without generating subsurface damage is strongly required because of the increasing demand of low-cost Si wafers. The etching-assisted slicing method is abrasive free machining process employing chemical etching of Si. The method can achieve a lower kerf loss than the mechanical slicing and damage-free Si surface. In this paper, the removal characteristics of Si ingot are discussed under the different slicing conditions.

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