アレイ探触子の移送による多点計測を利用した広域FSAPイメージング

抄録

A wide area imaging using an array probe is investigated in this research. In this research, we develop the full waveforms sampling and processing (FSAP) technique for the wide area imaging. Since it is difficult to reconstruct the flaw image beyond the aperture width of the array probe, we consider the stacking image at multiple array positions. Here, it is required to compensate the intensity of the image for overlapping reconstruction area. A normalization technique using the pressure field calculated with the Multi-gaussian beam model is applied to the stacking process in the FSAP. By the migration of array probe, we smoothly reconstructed the shape of the flat bottom surface in a specimen.