年次大会講演論文集
Online ISSN : 2433-1325
会議情報
830 リフロープロセスの影響を考慮した電子パッケージはんだ接合部信頼性予測
酒井 秀久于 強白鳥 正樹茂木 正徳
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会議録・要旨集 フリー

p. 273-274

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It is concerned that residual stresses of solder joints in package assembly process are small because of solder joint stress relaxation. However, lead free solders are developed and applied to electronic devices today. It is uncertain that we can neglect solder joints residual stresses in lead free assembly process. Therefore, authors consider effects of package assembly process (reflow process) for solder joint reliability by using FEM analysis.
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© 2002 一般社団法人日本機械学会
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