The proceedings of the JSME annual meeting
Online ISSN : 2433-1325
2008.4
Session ID : 3404
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3404 Study on ultra-planarization process using water-soluble fullerenol : the 2nd report
Hideyuki TACHIKAYasuhiro TAKAYATezutake HAYASHIKen KOKUBO
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Abstract

CMP (Chemical Mechanical Polishing), which is a polishing process combining chemical effect by chelating agent and mechanical effect by abrasive grain, is a key technology for multilayered semiconductor. In this study, we propose the water-soluble fullerenol(C_<60>(OH)_x (X=12-44)) as abrasives. Because water-soluble fullerenol has good features such as uniformity of particle size (1 nm) and no metal contamination, it is suitable for abrasives of Cu-CMP in next-generation design rule. In this report, the planarization performance of water-soluble fullerenol slurries is investigated experimentally. It is investigated that the water-soluble fullerenol slurry can planarize the copper surface from 20 to 0.5 nm RMS in 2 min.

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© 2008 The Japan Society of Mechanical Engineers
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