1219 Mapping Measurement of Stress Components by Raman Microspectroscopy with Sub-micro Scale Spatial Resolution
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It is very important to grasp stress and strain states in sub-micro scale area. In this study, stress and strain components in the single crystal sapphire and polycrystalline alumina were determined by the Raman microspectroscopy. First, the relationships of A_<1g> and E_g modes between the change of Raman shift and strain components were theoretically derived and 20 unknown parameters were experimentally determined. Second, stress measurements around the notch root in the single crystal sapphire was conducted. Then, components of strain were determined by Raman microspectroscopy and stresses were calculated by using Hook's law. The measured stresses were good agreement with FEM results. Last, mapping measurement of residual stresses and local stresses in polycrystalline alumina were conducted. The applicability of Raman micro-spectroscopy to stress/strain measurements in sub-micro scale area was confirmed.
