抄録
Static and sliding frictions of probe sample contacts play a vital roll on the micro/nanomanipulation of nanowires. In this study, using a new experimental method, the normal contact force and the friction force between the very-thin Pt wire and W probe has been measured accurately by using a single sensor. In the method, the force required to axial pullout of Pt nanowire against the local contacts of closely positioned two opposite probes is determined with the variation of normal pressure and sliding speed. The static friction coefficient is found to be dependent on sliding speed whereas the kinetic friction coefficient is found independent of the sliding speed.
