抄録
A new method for measurement of the 3D surface profile of continuously moving objects is proposed. A grid pattern made of an interference of plane wave is projected on a moving object. The deformed grid patterns projected on an object are acquired by three linear sensors continuously. Since a liner sensor records the light intensity on a single line along the reference grid pattern, the result of the image forms a moire fringe pattern which represents contour lines. Using three images obtained by three linear sensors, the phase distribution of the moire fringe pattern is calculated by a phase-shifting method. The phase of the moire fringe pattern is simply proportional to the height of the object. The image sampling and analysis are performed at high speed because of linear sensors This algorithm and an experimental result are shown.
