Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE
Online ISSN : 2424-3132
2003
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P-CM-04 FEM Analysis of Multilayered MEMS Device under Thermal and Residual Stress
Jun Hyub ParkHyeon Chang Choi
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 333-334

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Abstract
It is essential to ensure their reliability to produce a MEMS on commercial scale. Reliability problem in inkjet printhead is also very important. To eject an ink drop, temperature of heater must be high so that ink contacting with surface reaches above 300℃ on the instant. Its heater is embedded in the thin multi-layer in which several materials were deposited. MEMS processes are the main sources of residual stresses development. Residual stresses are the main factor reducing the reliability of MEMS devices. We measure residual stresses of single layers that consist of multiplayer. We optimize thickness of each layer using them so that maximum stress in residual stress distribution can be minimized.
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© 2003 The Japan Society of Mechanical Engineers
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