Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE
Online ISSN : 2424-3132
2003
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P-IM-02 DEVELOPMENT OF A NOVEL OPTICAL STYLUS SENSOR FOR SURFACE PROFILING INSTRUMENT
Hiroya FUKATSUKazuhisa YANAGIAtsushi SHIMAMOTO
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 337-338

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Abstract
A profile measurement system using an optical stylus was proposed, which is robust to speckle included in the reflected light from the object surface. This measurement system consists of a displacement-measurement optical system using focus-error detection and a system that only measures speckle noise. Measurements were taken of engineering surfaces for which speckle are easily attained, and it was found that the proposed measurement system could remove the effects of speckle noise and obtain a surface profile close to that obtained by a mechanical stylus instrument.
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© 2003 The Japan Society of Mechanical Engineers
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