Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE
Online ISSN : 2424-3132
2009
Session ID : P-IMG-04
Conference information
P-IMG-04 BEAD CARRY-OUT IN TWO-COMPONENT BRUSH SYSTEM OF ELECTROPHOTOGRAPHY(Imaging and Printing Technologies,Technical Program of Poster Session)
Tatsushi MURAKAMISatoshi IESAKATakashi ADACHIHiroyuki KAWAMOTO
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
"Bead-carry-out" phenomenon in the two-component magnetic brush development system of electrophotography is analyzed. We have investigated characteristics of the BCO on the effect of the development voltage to find the optimum condition for decreasing the BCO. Additionally, the behavior of carrier particles in the development area has been observed with a high-speed CCD camera in order to recognize dynamics of the BCO.
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© 2009 The Japan Society of Mechanical Engineers
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