Abstract
In order to investigate the high-cycle fatigue behavior of submicron Au single crystal, resonant fatigue is conducted for a specimen with a submicron-scale test section. The displacement range at the end of weight, Δδ_1, is measured by means of in-situ SEM observation. Δδ_1 monotonically increases with increasing ΔV_<in>/2 (ΔV_<in>/2: input voltage amplitude). However, Δδ_1 decreases at 2.7×10^5 cycles of ΔV_<in>/2=2.25 V, and crystallographic slip bands and extrusions and intrusions with a width of 15 nm are formed on the surface of the test section. The critical stress for the slip bands formation is evaluated to be higher than 200 MPa by the FEM analysis. Although the morphology of the slip bands are similar to persistent slip bands in bulk, the size and the formation stress are extremely different from those of bulk.
