OS1511 Damage of CNT Network under High Current Density
Details
Multi-walled carbon nanotubes (MWCNTs) are highly resistant to deformation, and their electrical characteristics are resistant to degradation by ambient conditions. The damage mechanisms of CNT are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, we investigated the damage mechanism of MWCNT structures used as nano-component of electronic devices. A high current density testing system was applied to the micro meter-sized line constructed by MWCNT network. The MWCNT line of 30 μm width and 800 μm length was fabricated. Initially the electric resistance of MWCNT wires decreased in the DC loading. And the resistance began to increase after 10h under the condition of initial voltage of 4V applied. The open circuit was occurred at 55h passed under the condition.
