In order to incorporate the Ag nanowire meshes into the opto-electronic devices as TCE, it is important to investigate their reliability. It is well known that the corrosion of Ag is a common phenomenon, which will decrease the cross-sectional area of Ag nanowire, and may degrade the Ag nanowire mesh. Therefore the aim of present work is to investigate the effect of corrosion on the electrical breakdown of an Ag nanowire mesh. Firstly, the numerical analysis on the melting behavior of an Ag nanowire mesh was conducted. Secondly, by utilizing the figure of merit, the current-carrying capacity of the Ag nanowire mesh subjected to corrosion was calculated by simple conversion. It shows that the current-carrying capacity is decreased with the decrease of cross-sectional area of Ag nanowire caused by the corrosion. Moreover, the lifetime of the Ag nanowire mesh subjected to corrosion stressed with current was predicted.