生産加工・工作機械部門講演会 : 生産と加工に関する学術講演会
Online ISSN : 2424-3094
セッションID: 312
会議情報
312 光学式仮想Vブロック方式によるスピンドル回転誤差測定(OS10 加工計測・評価)
石田 徹吾柳 和久山田 隆一
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会議録・要旨集 フリー

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抄録
A run-out measuring instrument with capacitance displacement probe is widely used in industry. However, this measurement method has the defect that measurement result depend on a feature of measured object. Furthermore, attachment error between measured object and spindle is never detected in measurement at are section. In this paper, we compare the optical measurement by virtual V-block method which does not depend on a feature of a measured subject to 2-point method with capacitance displacement probe in view of measurement principle. And we show how to separate the attachment error from the run-out error of a spindle.
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© 2004 一般社団法人 日本機械学会
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