抄録
Today, there is an increased need for quality control in the manufacturing sectors. Particularly, the automated detection of the product surface defect is essential to fulfill the requirement of quality assurance. In this study, we propose an algorithm of surface defect detection by application of wavelet transformation to the image processing. The algorithm is based on the differences of defect in the spatial frequency. This paper provides the algorithm and results of experiment that show the effects of process parameters on the detection accuracy.
