素材物性学雑誌
Online ISSN : 1884-6610
Print ISSN : 0919-9853
ISSN-L : 0919-9853
反応性蒸着法によるInN薄膜の作製及び電気的光学的特性
佐藤 祐一佐藤 進
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1989 年 2 巻 1 号 p. 92-99

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InN thin films, which are less studied III-V compound semiconductors, are prepared by a rf excited reactive evaporation method on glass or semi-insulating GaAs (100) substrates. The deposition conditions of the films are discussed and structures and electrical and optical properties of them are investigated. Relatively high mobility is obtained when the substrate temperature is high and the nitrogen gas pressure is low. On the other hand, relatively low carrier density is obtained when the substrate temperature is low and the nitrogen gas pressure is high. Color of the InN thin film is dark red and its band gap energy is 1.92 eV. Crystallinity of the InN thin films are improved by using the GaAs substrates.
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