Ni内部電極チップコンデンサの微細構造について

抄録

Effect of microstructure on load life characteristics of insulation resistance (IR) has been studied with multilayer ceramic capacitors with Ni-electrode. It is found that the formation of oxygen vacancies under the firing in reducing atmosphere and the discrepancy of grain boundary composition from the nominal composition are the causes of the short life time. In case of high oxygen partial pressure at annealing, the formation of oxygen vacancies was suppressed and the IR load life time was prolonged. Donor additives such as Y₂O₃ are also valid to suppress the formation of oxygen vacancies.
The suppression of the formation of oxygen vacancies and the control of grain boundary chemistry were effective to prolong the IR load life time.