B132 Thermal property measurement of transferred vertically aligned single-walled carbon nanotube films by utilizing heating effect from excitation laser of Raman spectroscopy

Abstract

An experimentally simple method utilizing the excitation laser of the Raman system to heat the VA-SWNT film and measure temperature simultaneously for measuring the thermal conductivity and the film-substrate thermal contact resistance of the vertically-aligned single-walled carbon nanotubes (VA-SWNTs) is applied to measure the thermal contact resistance of the transferred film. The method finds the thermal contact resistance at the film-substrate interface of the transferred film to be around four times larger than the original VA-SWNT film grown on Si substrate.