The Proceedings of the Thermal Engineering Conference
Online ISSN : 2424-290X
2012
Session ID : F132
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F132 Fast Scanning Calorimetry with MEMS Chip Calorimeter
Junichi IshiiTaiki NakamuraOsamu Nakabeppu
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Thermal analysis and calorimetry are basic techniques to characterize the thermal properties of materials. By the introduction of MEMS technology, highly sensitive and fast response chip calorimeters have been available. This paper reports the melting behavior of an isothermally crystallized PET investigated by the fast scanning calorimetry. In temperature scan rates of 25-400 K/s, DSC curves of the PET shsowed two separate melting peaks because reorganization of the original crystalline structure occurred during temperature scan. On the other hand, fast temperature scans over 700 K/s kept the PET sample original structure and one melting peak of the original crystal was observed in DSC curve.
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© 2012 The Japan Society of Mechanical Engineers
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