The Proceedings of the Thermal Engineering Conference
Online ISSN : 2424-290X
2015
Session ID : G222
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G222 Non-intrusive Imaging of Ion Diffusion in the vicinity of Liquid-solid Interface in Microchannel Flow using Total Internal Reflection Raman Scattering
Tetsuro TateishiYohei Sato
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Abstract
This paper proposes a non-intrusive measurement technique for the ion concentration distributions at liquid-solid interfaces in microchannel flow using total internal reflection Raman imaging. The technique uses spontaneous Raman scattering excited by evanescent wave. The evanescent wave was generated at a glass-solution interface by total internal reflection using an optical system employing two prisms. The calibration result showed a linear relationship between the Raman intensity ratio and the ion concentration of NH_4Cl deuterium oxide solution. Using this calibration, further experiments will be performed for non-intrusive measurement of the ion concentration distributions in mixing area of D_2O and NH4Cl deuterium oxide solution at liquid-solid interfaces.
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© 2015 The Japan Society of Mechanical Engineers
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