温度計測によるナノワイヤネットワークでの電流経路・発熱への接点抵抗分布の影響評価

抄録

A network consisted of Ag-nanowires (Ag-NWs) will make a transparent and flexible highly conductive films, and can be used in electronic devices and heaters. The electrical current distribution of the Ag-NW network is not uniform and can form hot spots in the area of high-current flow, which have significant impact on the performance and lifetime of the Ag-NW network. In this study, we measured the temperature of the Ag-NW in the Ag-NW network using the thermoreflectance imaging. We derived the contact resistance and current distribution from the temperature distribution based on an inverse problem analysis. The value of the contact resistance was 5.5 3.8 × 10⁵Ω and showed large variance. Based on the probability density distribution of the current distribution, we showed that that the large variance of contact resistance increases the area of high current concentration and hot spots in Ag-NW network.