東北支部総会・講演会 講演論文集
Online ISSN : 2424-2713
セッションID: 418
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418 干渉計による球面形状の精密測定法(第2報)座標変換精度の向上(精密加工・測定・生産システム)
強 学鋒高 偉清野 慧
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It is necessary to remove the form error of the reference flat from the interferometer datum for improving the accuracy of the spherical profile measurement using interferometers. For this purpose, a new method called the 2 position- 4 point method was proposed. In this method, form error of the reference flat along a closed circle can be removed. Data points along the circle are necessary for the data processing of this method. However, phase-measuring devices in most interferometers are square-grid detectors, and the data need to be conversed to polar grid array. In this paper, a method is presented to improve the accuracy of the data conversion.
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