The Proceedings of Conference of Tohoku Branch
Online ISSN : 2424-2713
2006.41
Session ID : 123
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123 Effect of line-shape on threshold current density in polycrystalline lines
Nao YAMAJI, Kazuhiko SASAGAWA
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Keywords: Electromigration, Atomic Flux Divergence, Drift, Polycrystalline Line, Threshold Current Density
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© 2006 The Japan Society of Mechanical Engineers
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