The Proceedings of Conference of Tohoku Branch
Online ISSN : 2424-2713
2009.44
Session ID : 122
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122 Testing of the Electromigration Resistance of High Purities Al Based on Atomic Flux Divergence Method
Xu ZHAO, Masumi SAKA, Mitsuo YAMASHITA, Fumiaki TOGOH
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Keywords: Electromigration, High Purity Al, Atomic Flux Divergence, Grain Boundary Diffusion
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© 2009 The Japan Society of Mechanical Engineers
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