The Proceedings of Autumn Conference of Tohoku Branch
Online ISSN : 2424-2721
2009.45
Session ID : 106
Conference information
106 Testing on Migration Resistance of Ultra-high Purity Aluminum Thin Films Under Accelerated Thermal Cycling
Takahiro SUGANO, Shien RI, Masumi SAKA, Mitsuo YAMASHITA, Fumiaki TOGOH
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Keywords: Power Device, Accelerated Thermal Cycling, Migration Resistance, Ultra-high Purity, Aluminum Thin Films
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© 2009 The Japan Society of Mechanical Engineers
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