The Proceedings of Autumn Conference of Tohoku Branch
Online ISSN : 2424-2721
2010.46
Session ID : 106
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106 Effect of Line Shape on Threshold Current Density of Electromigration Damage in Interconnect Tree
Takehiro ABO, Kazuhiko SASAGAWA
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Keywords: Electromigration, Interconnect Tree, Simulation, Atomic Flux Divergence
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© 2010 The Japan Society of Mechanical Engineers
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