The Proceedings of Conference of Tokai Branch
Online ISSN : 2424-2748
2012.61
Session ID : 129
Conference information
129 Directional selection of Complex Wavelet Packet Transform and application to defect inspection of semiconductor circuit
Takeshi KATO, Zhong ZHANG, [in Japanese], [in Japanese], [in Japanese]
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Keywords: Wavelet Packet Transform, Image Processing, Directional Selection, Semiconductor Circuit, Defect Detection
CONFERENCE PROCEEDINGS FREE ACCESS

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© 2012 The Japan Society of Mechanical Engineers
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