The Proceedings of Conference of Tokai Branch
Online ISSN : 2424-2748
2016.65
Session ID : 103
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103 The Study on Independent Detection Triply Degenerate Raman Line of Si by Raman Microspectroscopy
Yuki KAWAUCHI, Kyohei TSUNODA, Hirohisa KIMACHI, Junya IMAIZUMI
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Keywords: Si, Raman spectroscopy, Triply Degenerate Raman Line, Raman tensor, Single crystal
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© 2016 The Japan Society of Mechanical Engineers
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