Proceedings of the 1992 Annual Meeting of JSME/MMD
Online ISSN : 2433-1287
2004
Session ID : 132
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Observation of Fatigured Surfaces by the Sensitivity-Enhanced Atomic Force Acoustic Microscope
Mikio MURAOKA, Shinji KOMATSU
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Keywords: Atomic Force Microscopy, Contact Stiffness, Cantilever, Resonance, Concentrated Mass
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© 2004 The Japan Society of Mechanical Engineers
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