抄録
An X-ray stress measurement technique applicable to a confined area - dual-axis inclining method - has been developed to measure three stress components of an plane stress state. The present method is composed of the iso-inclination scanning (angle : ±ψ) and the side-inclination scanning (angle : Ω). The ±ψ scanning under the condition of Ω ≠ 0 results in the ψ-splitting even if the measured area is in the plane stress state. The amount of the ψ-splitting depends on the value of Ω and the shear stress component. The average of the diffraction angles in the ψ-splitting is proportional to sin2ψ. The proportional constant indicates not a true normal stress but an apparent normal stress because of the condition of Ω ≠ 0. The apparent normal stress is proportional to sin2Ω. Its gradient and y-intercept depend on the two orthogonal normal stress components respectively. The difference of the diffraction angles in the ψ-splitting is proportional to sinΩsin|2ψ|. Its gradient is proportional to the shear stress component. The validity of the present method was verified by applying the present method and the conventional method to a flat specimen respectively, and by comparing the values measured.
