材料
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
論文
二重露光法による粗大粒材の応力測定
鈴木 賢治菖蒲 敬久城 鮎美
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2019 年 68 巻 4 号 p. 312-317

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The double exposure method (DEM) is proposed herein as a new X-ray stress measurement method for coarse grain materials. A diffraction angle can be obtained from an incident and a spotty diffracted beam. Each X-ray beam is measured by an area detector on a linear motion stage on the 2 θ-arm in the DEM. To examine the validity of the DEM, the residual stress of the plastically bent specimen was measured. In addition, the residual stress distribution of the indentation specimen was measured. The result by the DEM was similar to the result simulated by the finite element method. As a result, the DEM is useful for the X-ray stress measurement method for coarse grain material.

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