Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Lecture
Perspective of Semiconductor Technologies Contributed to the IoT Society
III: Two-Dimensional Characterization of Wide-Bandgap Materials and Contact Interfaces by Using Scanning Internal Photoemission Microscopy
Kenji SHIOJIMA
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Keywords: Wide-bandgap semiconductor, Schottky contact, Scanning internal photoemission microscopy, 2-dimentional characterization, Inhomogeneity
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2020 Volume 69 Issue 11 Pages 837-842

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