抄録
In this paper is described the X-ray stress camera specially designed for stress measurement by a photographic method. This apparatus may be used by either grocker's method, Schaals Method or sin2φ method.
We tried to record a diffraction pattern in a short time's exposure, using a specially designed short anode X-ray tube, with reduced distance between the object and the focus.
The microphotometer, the film puncher and the electro polisher are also developed in consequence.
