材料
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
半導体検出器を用いたX線応力測定
細川 好則大澤 澄人大谷 清兵衛阪野 明三好 良夫
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ジャーナル フリー

1994 年 43 巻 490 号 p. 766-771

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A stress analyzing instrument was developed based on the energy dispersive X-ray diffractometry. 4-point bending stress in steel specimens was tried to measure by using the side-inclination method. It was found that the energy-sin2ψ (En-sin2ψ) diagram, which corresponds to 2θ-sin2ψ in the side-inclination method, showed good linearity and accuracy as same as the conventional method. The relationship between the mechanically determined stress and X-ray determined stress was also linear. In conclusion, this method is useful to stress measurement.

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