抄録
Recently, the accuracy of stress values by X-rays was highly improved. The reason seems to be the improvement of data processing by computer and equipment. However, it is sometimes difficult to determine the stress value with high accuracy when poor diffraction profiles with scattering noise and distorsion were measured. These profiles often depend largely on the experimental conditions. Thus, it is required to select the most suitable one by use of a certain parameter on the X-ray diffraction.
On the other hand, fractal geometry is being introduced for an analysis of irregular time series. It may be applicable in the field of X-ray diffraction because the diffraction profile is a kind of irregular time series. So, it is attempted here to obtain a new interpretation about X-ray diffraction profile by the fractal analysis.
In the present study, it was investigated first whether X-ray profile has the fractal characteristics or not. The result obtained showed clearly the fractal characteristics. The X-ray parameters were compared with the fractal dimension D for each experimental condition, and the condition of the minimum error on the experimental result was obtained. It seems possible to select a most suitable experimental condition by using the fractal dimension as a parameter.
