抄録
In this work, an estimation of residual stress by using the IF method was presented for assumed nonuniform distributions of residual stress. By applying the present procedure to the case of ground silicon nitride, it was revealed that compressive residual stresses estimated for non-uniform stress distributions were almost twice as large as those for the uniform stress distribution. A larger residual stress was estimated in the material ground using a rougher wheel. Comparing results by X-ray stress measurements, it was suggested that the residual stress was reasonably estimated by the present procedure.
