2000 年 49 巻 12Appendix 号 p. 275-280
Recently, the position sensitive proportional counter (PSPC) has been becoming popular as a detector for X-ray stress measurement. However, little information is available in the literature regarding the effects of specimen mis-setting and/or collimator misalignment on the stress measurement. Many factors such as the stress and the X-ray diffraction broadening of the specimen, the X-ray focus size, the dimensions of the collimator, the PSPC and the goniometer are complicatedly related to the effects of specimen mis-setting and/or collimator misalignment. In this paper, a modeling of the X-ray stress measurement using a PSPC as the detector is presented enabling us to simulate the stress measurement under various conditions. In the case of Ω assembly, the errors in stress measurement are illuminated under specimen mis-setting and/or collimator misalignment.
