Abstract
In order to reduce the volume of test data, built-in self test (BIST) and BIST-aided scan test (BAST) techniques have been proposed. To provide the test pattern generated by an automatic test pattern generator (ATPG) using BAST, we enhanced the structure of a pseudorandom pattern generator (PRPG) by inserting MUXes and NOT gates in the linear feedback shift register (LFSR) based on correlations of ATPG patterns. The procedures can achieve about 15 to 56% reduction in the volume of test data for BAST.
