Influence of a Heterogeneous Sample Surface on a Driven Microcantilever Probe Model
2019 年 23 巻 4 号 p. 141-144
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2019 年 23 巻 4 号 p. 141-144
An atomic force microscope (AFM) is a microscope that measures the information of a sample surface when the probe tip approaches the surface. In our previous work, we investigated a mass-spring model of the driven probe tip influenced by a homogeneous sample. In this study, we investigate the influence of a heterogeneous sample surface on the amplitude characteristic of the tip oscillation by comparing the calculated amplitude and the theoretically obtained amplitude using a bifurcation theory.
