Journal of the Japan Society for Precision Engineering, Contributed Papers
Online ISSN : 1881-8722
Print ISSN : 1348-8724
ISSN-L : 1348-8716
Paper
Improvement of Thickness Uniformity of Quartz Wafer by Numerically Controlled Plasma CVM
—Development of the NC-PCVM Machine and Acquisition of Machining Properties—
Kazuya YAMAMURAMasafumi SHIBAHARAYasuhisa SANOTsuyoshi SUGIYAMAKatsuyoshi ENDOYuzo MORI
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2005 Volume 71 Issue 4 Pages 455-459

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Abstract
For the purpose of machining an ultra high frequency quartz resonator, we study making of quartz wafer with uniform thickness by Plasma CVM. In this paper, it was examined that relationship between machining characteristics and elements of equipment (shield of electric field, surface roughness of vacuum chuck, etc.). Machining of quartz wafer was carried out by utilizing the rotary electrode. Then, following results were obtained. First, by setting dummy quartz wafers around the objective sample, the boundary condition of process was stabilized, and vaiation of removal depth on quartz wafer was improved. Second, the linear relationship between dwelling time of plasma and removal depth was obtained, and it was proven that high-precision machining of quartz wafer by the numerically controlled plasma CVM was possible.
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© 2005 by The Japan Society for Precision Engineering
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