抄録
Microwave reflectometry is a plasma diagnostic that launches microwaves to a plasma and measures the wave reflected at a cutoff layer in the plasma. It is used mainly for density profile and density fluctuation measurements. This lecture note is written for those who want to make a reflectometer and apply it to a target plasma. Various types of microwave reflectometers and a simple numerical tool useful for designing a system and for analyzing data are described. Details of a virtual system are also explained.
