アニーリングによるパラメータ推定を伴う最大エントロピー法に基づく画像復元
1998 年 37 巻 2 号 p. 15-22
詳細
1998 年 37 巻 2 号 p. 15-22
A method for spatial resolution enhancement based on Maximum Entropy Method (MEM) with simulated annieling is proposed. Using overlap sampling with a low resolution of sensor, high spatial resolution (corresponding to the sampling interval) can be achieved through ground data processing with image restoration methods. Through the experiments with simulation imagery data derived from AVHRR data, it was found that spatial resolution enhancement can be achieved, MEM is superior to the others when S/N is poor (less than 33) while Conjugate Gradient method is superior when the S/N is higher than 33. It was also found that the Conjugate Gradient method is superior to the proposed method for the existing sampling jitter.
