Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Special Issue on Nitride Semiconductor Surfaces
Effect of Low-temperature Deposited Layer on the Growth of Group-III Nitrides on Sapphire
Hiroshi AMANOIsamu AKASAKI
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2000 Volume 21 Issue 3 Pages 126-133

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Abstract
Surface control by low-temperature deposited buffer layer enables the growth of high-quality GaN on a sapphire substrate the lattice mismatch of which is as large as 14%. With use of such highly mismatched systems, novel electronic devices such as new lighting source which replaces conventional light bulb, super-high-density optical storage systems, high-power and high-speed transistors and UV image sensors for remote sensing and flame detection will be realized. This paper describes the details of the mechanism of this surface control technology.
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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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