Abstract
A new technique for preparing cross-sections was developed on unembedded in supporting medium and structural elements unchanged with paper and printed paper. In this method, a focused ion beam (FIB) was irradiated to it. The FIB technique was applied as an improved method to various papers and printed papers. As a result, smooth cross-sections of paper and printed paper composed of materials with different hardness were successfully prepared and the micro-photograph without structural change or artifact was satisfactorily obtained. Further, clear image of the printed ink transferred to paper was observed for the first time by this method. However, penetration behavior of the ink vehicle into the substrate structure could not be directly observed through scanning electron microscope (SEM), because there is no generation of contrast between the printing vehicle and the printed paper. Hence, in order to obtain useful information on interaction between the substrate structure and the ink of the printed paper, a new technique was developed by combining FIB method with electron probe micro analyzer (EPMA) measurement after osmium labeling of the unsaturated carbon double bonds in the vehicle. A distribution of the vehicle transference and penetration into the paper could be observed using the new method.
