Abstract
It is important to understand the interfacial properties of the nanotube/metal contacts because, in the case of carbon nanotube field-effect transistors (NT-FETs), the FET action is dominated by the Schottky barrier formed at the interface of the source contact. In this study, we have studied the interfacial properties from the electrical characterization of NT-FETs. First, the conduction pass in the vicinity of the contact electrodes has been investigated using a multi-terminal device. Then, the relation between conduction property of NT-FETs and work function of the contact metals has been investigated. The interfacial band structure has been discussed in terms of the temperature dependence of the drain current.
