Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Special Issue: Frontiers of Aberration-Corrected Atomic Scale Electron Microscopy
Electron Microscopy for “Nano-in-Macro”
Kunio TAKAYANAGIYoshifumi OSHIMASoyeon LEETakayuki TANAKAYasumasa TANISHIRO
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2013 Volume 34 Issue 5 Pages 226-233

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Abstract
Aberration corrected electron microscopy has revealed various aspects of materials and their functions, i.e., interfacial, ionic, chemical, photonic, plasmonic, magnetic and electronic aspects. A 50 pm resolution microscopy, particularly, enabled us to observe lithium ions in LiMn2O4, a material used as lithium ion battery electrodes. The 50 pm electron probe scanning over the surface is sensitive enough to detect a single adatom/vacancy similarly to STM. The 50 pm microscopy, in transmission mode of observation, is useful for study of catalysis, as demonstrated for Au/TiO2 in O2 and/or CO environment. Aberration corrected in-situ electron microscopy provides atomic, ionic, and electronic properties, in relation to structures at “nano in macro”.
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https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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