Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Transaction of the 36th Conference on Surface Science [II]
Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers
Yuki WAKISAKAYuya IWASAKIHiromitsu UEHARAShingo MUKAIDaiki KIDOSatoru TAKAKUSAGIYohei UEMURATakahiro WADAQiuyi YUANOki SEKIZAWATomoya URUGAYasuhiro IWASAWAKiyotaka ASAKURA
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2017 Volume 38 Issue 8 Pages 378-383

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Abstract

A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A home-made log-spirally bent crystal Laue analyzer was made and evaluated. It was revealed that higher XAFS signals were obtained with the home-made analyzer than with the commercial one.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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